Coordination of Nanometrology & Standardization Workshop
June 2nd 2009, ENF2009, Prague, Czech Republic
To demonstrate that any product or manufacturing process meets a specified functional demand requires quantitative measurements traceable to an agreed metrology unit. Hence to bring nanotechnology through to successful business calls for access to the relevant metrology tools that provide the ability to measure in three dimensions with atomic resolution over large areas.
Focus:
This workshop will provide an understanding of the critical importance, benefits and implementation of standards for those working within both the industrial and academic nanotechnology field. It will be run as a complimentary workshop at the EuroNanoforum 2009.
Speakers:
Dr Steffi Friedrichs, Nanotechnology Industry Association, Belgium
“The Importance of Standards to the Nanotechnology Industries” (abstract)
Dr Gert Roebben, Institute for Reference Materials and Measurements, Belgium
“Application of Documentary Standards in the Characterisation of Manufactured Nanoparticles” (abstract)
Dr Wolfgang Unger, Federal Institute for Materials Research and Testing, Germany
“Metrological Challenges in Surface Nano Analysis” (abstract)
Dr Hermann Stamm, Institute for Health and Consumer Protection, Italy
"Nanosafety Measurements and Testing: Standardisation and Harmonisation Needs"
Dr Thorsten Dziomba, Physikalisch-Technische Bundesantalt (PTB), Germany
"Standards for Scanning Probe Microscopy " (abstract)
Programme
Start Time: 9.30
Finish Time: 13.00
Programme >>
Workshop Registration:
This workshop is provided free of charge to EuroNanofourm 2009 delegates. For the participation at the workshop, please, register via the standard registration form of the EuroNanoForum 2009 on: http://www.euronanoforum2009.eu/registration/index.php.
Contact:
For further information on this workshop please contact:
Katie Zmijewski, ASCAMM Foundation:
tel: +34 93 594 47 00