To demonstrate that any product or manufacturing process meets a specified functional demand requires quantitative measurements traceable to an agreed metrology unit. Hence to bring nanotechnology through to successful business calls for access to the relevant metrology tools that provide the ability to measure in three dimensions with atomic resolution over large areas.
Focus:
Provided below are a series on presentations compiled by leading experts in the field which address the critical importance, benefits and implementation of standards for those working within both the industrial and academic nanotechnology field. These materials were originally presented at EuroNanoforum 2009, June 2009.
Authors and Presentations:
Dr. James E. Johnstone, UK Nanotechnology Knowledge Transfer Network, UK "Overview of Standards for Nanotechnologies"
Dr Gert Roebben, Institute for Reference Materials and Measurements, Belgium “Application of Documentary Standards in the Characterisation of Manufactured Nanoparticles”